A test measurement system and method which uses parallel digital samples of an input measurement signal to determine a trigger point for a predetermined trigger waveform. The system correlates the predetermined trigger waveform with digital samples of the input measurement signal. The result of this correlation is then used to identify a trigger point. Generally the point in time where the trigger waveform has the strongest correlation with the digital samples identifies the desired trigger point. This trigger point is then used to identify the selected measurement data, where the selected measurement data corresponds to the digital samples obtained at the trigger point time.