An eddy current inspection system and method for inspecting a component is
provided. The system includes an eddy current probe for sensing eddy
currents from the component and an analog to digital converter configured
for converting eddy currents to digital signals. The system also includes
a processor configured for generating an eddy current image from the
digital signals and pre-processing the image to enhance a quality of the
image. The processor is configured to identify regions displaying flaw
patterns and calculating a defect characterizing parameter for the
identified regions.