Provided are systems and methods for multi-channel non-destructive inspection which provide high data throughput, logarithmic amplification of large dynamic range, and simplicity of supporting electronics. More specifically, provided are systems and methods for inspecting a structure that may use an interface board, two pulser boards, each coupled to 16 transmit channels, and two receiver boards, each coupled to 16 receive channels, where the receiver boards are capable of processing data from the 32 receive channels by logarithmically amplifying at least 70 dB of dynamic range. A receiver board may include a serial connection of two layers of multiplexing switches to provide 70 dB isolation between channels, a logarithmic amplifier for logarithmically amplifying 70 dB of dynamic range, a linear amplifier, and an analog-to-digital converter.