A low-cost single-sided NMR sensor to produce depth profiles with microscopic spatial resolution is presented. The open geometry of the NMR sensor provides a non-invasive and non-destructive testing method to characterize the depth structure of objects of arbitrary size. The permanent magnet geometry generates one plane of constant magnetic field intensity parallel to the scanner surface. By combining the highly uniform static gradient with selective RF excitation, a thin flat sensitive slice can be defined. By moving the relative position between the slice and the object, one-dimensional profiles of the near surface of large samples are produced with high spatial resolution.