A first thin film transistor including a gate electrode, a source region, a drain region, a GOLD region, and a channel region is formed at a first region at a TFT array substrate. A second thin film transistor including a gate electrode, a source region, drain region, a GOLD region, and a channel region is formed at a second region. The GOLD length (0.5 .mu.m) of the GOLD region of the second thin film transistor is set shorter than the GOLD length (1.5 .mu.m) of the GOLD region of the first thin film transistor. Accordingly, a semiconductor device directed to reducing the area occupied by semiconductor elements is obtained.

 
Web www.patentalert.com

> Measuring method and apparatus using attenuation in total internal reflection

~ 00372