A method for measuring the holding properties of a TFT array of an active matrix display panel comprising multiple pixel circuits with holding capacitors, this measuring method being characterized in that the multiple pixel circuits comprise at least a first pixel circuit and a second pixel circuit, and the method comprises a step for charging to the holding capacitor of the first pixel circuit, a step for then charging to the holding capacitor of the second pixel circuit, a step for performing an effect-eliminating procedure due to floating capacity, and a step for measuring the charge of the holding capacitor of the first and second pixel circuits wherein a predetermined holding time after charging has elapsed.