A nonvolatile ferroelectric memory device is provided so as to control
read/write operations of a nonvolatile memory cell using a channel
resistance of the memory cell which is differentiated by polarity states
of a ferroelectric material. In the memory device, an insulating layer is
formed on a bottom word line, and a floating channel layer comprising a
P-type drain region, a P-type channel region and a P-type source region
is formed on the insulating layer. Then, a ferroelectric layer is formed
on the floating channel layer, and a word line is formed on the
ferroelectric layer. As a result, the resistance state induced to the
channel region is controlled depending on the polarity of the
ferroelectric layer, thereby regulating the read/write operations of the
memory cell array.