The present invention relates to a far field light microscopical method,
respectively a system and a computer program product for analysing at
least one object having a subwavelength size in at least one spatial
direction to obtain spatial information of the object, in particular size
and topology thereof, comprising the steps of:--labelling the object(s)
with one or more suitable optical markers;--providing suitably structured
illumination light to at least partially illuminate the
object(s);--subjecting the object(s) to the structured illumination
light;--detecting an optical response of the object(s);--obtaining the
spatial information of the object(s) by comparing the obtained response
with simulation data of an optical response of object(s) having known
spatial information.