The present invention relates to a far field light microscopical method, respectively a system and a computer program product for analysing at least one object having a subwavelength size in at least one spatial direction to obtain spatial information of the object, in particular size and topology thereof, comprising the steps of:--labelling the object(s) with one or more suitable optical markers;--providing suitably structured illumination light to at least partially illuminate the object(s);--subjecting the object(s) to the structured illumination light;--detecting an optical response of the object(s);--obtaining the spatial information of the object(s) by comparing the obtained response with simulation data of an optical response of object(s) having known spatial information.

 
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> Thulium-doped heavy metal oxide glasses for 2UM lasers

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