An RFID device preparation system includes a printer combined with a short-range tester/reader. The tester/reader operatively couples to the RFID device using capacitive and/or magnetic coupling. By use of capacitive and/or magnetic coupling, good read characteristics may be obtained, while obtaining excellent discrimination between various RFID devices that may be in or near the tester/reader. Thus, RFID devices may be inexpensively and reliably tested one at a time, without appreciable interference or effect due to the presence of other RFID devices. The tester/reader may include electric-field and/or magnetic-field coupling elements that are configured to receive different signals, in order to test a variety of configurations of RFID devices. This may enable the device preparation system to accommodate various types and configurations of RFID devices, increasing versatility of the system.

 
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> RFID tag design with circuitry for wafer level testing

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