The invention is directed to a method for improving the depth
discrimination in optically imaging systems. It is applicable in
particular in light microscopy for improving image quality when examining
three-dimensionally extending objects. It is applicable in the method of
structured illumination as described in WO 97/6509. For this purpose,
influences due to variations in the brightness of the light source,
positioning of the imaged periodic structure and bleaching of the object
in fluorescence illumination are determined and taken into account in the
calculation of the object structure.