The X-ray inspection system 10 comprises an X-ray electron conversion face 42 for converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent face 46 for emitting fluorescence when an electronic image is entered, and deflecting means 44 which is installed between the X-ray electron conversion face 42 and output fluorescent face 46, wherein the electronic image which was entered and converted at the X-ray electron conversion face 42 is converged into a predetermined area on the output fluorescent face 46 by the deflecting means 44 so as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face 46. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.