Cross-correlation of delay line characteristics is described. An integrated circuit for cross-correlation testing includes: a first ring oscillator and a second ring oscillator. The first ring oscillator includes a first test circuit, and the second ring oscillator includes a second test circuit. The first test circuit is coupled via first programmable interconnects to first ring oscillator circuitry, and the second test circuit is coupled via second programmable interconnects to second ring oscillator circuitry. The first test circuit includes a first programmable delay line, and the second test circuit includes a second programmable delay line. The first test circuit and the second test circuit are configured to provide separately controllable outputs for cross-correlation as between the first programmable delay line and the second programmable delay line.