Systems and methods for testing components of printed circuit assemblies (PCA) that generate high frequency, low voltage swing signals or that operate using such signals are disclosed. High frequency, low voltage swing signals from the PCA are divided and translated to low frequency signals exhibiting voltage swings compatible with an in-circuit test platform for evaluation. Additionally, high frequency signals exhibiting voltage swings compatible with a PCA are generated. The signals are sent to the PCA for testing components. The division/translation or signal generation/translation logic may be bypassed, enabling the in-circuit test platform and the PCA to send signals between each other even if power to the system is off.