Methods and apparatus are provided for performing loopback testing of integrated circuits ("ICs"). In an embodiment of the invention, an IC can be tested on an undiced wafer by coupling a wireless transmitter of the IC to a wireless receiver of the IC. Core circuitry of the IC can be controlled to cause the transmitter to send at least one signal to the receiver. Upon receipt of the at least one signal, the receiver can send a signal to the core circuitry, which can determine, and possibly record, whether the transmission and receipt were successful. The invention advantageously facilitates efficient testing of unpackaged ICs at the wafer level.