Compounds of the formula (I) or (II) wherein R.sub.1 is
C.sub.1-C.sub.10haloalkylsulfonyl, halobenzenesulfonyl, C.sub.2-
C.sub.10haloalkanoyl, halobenzoyl; R.sub.2 is halogen or C.sub.1-C.sub.10
haloalkyl; Arl is phenyl, biphenylyl, fluorenyl, naphthyl, anthracyl,
phenanthryl, or heteroaryl, all of which are optionally substituted;
Ar'.sub.1 is for example phenylene, naphthylene, diphonylene,
heteroarylene, oxydiphenylene, phenyleneD-D.sub.1-D-phenylene or
--Ar'.sub.1-A.sub.1--Y.sub.1-A.sub.1--Ar'.sub.1--; wherein these radicals
optionally are substituted; Ae', is phenylene, naphthylene, anthracylene,
phenanthrylene, or heteroarylene, all optionally substituted; A, is for
example a direct bond, --0--, --S--, or --NR.sub.6--; Y, inter alia is
C.sub.1-C.sub.18alkylene; X is halogen; D is for example --0--, --S-- or
--NR.sub.6--; D, inter alia is C.sub.1-C.sub.18alkylene; are particularly
suitable as photolatent acids in ArF resist technology. ##STR00001##