Method and apparatus for generating a test program for an integrated circuit having an embedded processor. One embodiment has a system which includes an embedded microprocessor; a plurality of assembly language instructions stored in a memory, where the assembly language instructions substantially exercise a critical path or a path closest to the critical path in the embedded microprocessor; and programmable test circuitry having a programmable clock circuit for providing a multiplied clock signal to the embedded microprocessor in order to execute the assembly language instructions.