A fabrication process is provided for reducing leakage current in a field emission display having at least one electron emitter (24) electrically coupled to a ballast resistor (16) coupled to a cathode metal (14), wherein at least one defect (28) extends to a gate electrode (20) from a region (22) electrically coupled to the ballast resistor, the method comprising heating (32) to reduce the resistance of the ballast resistor; and applying (34) a voltage between the cathode metal and the gate electrode thereby creating a current through the at least one defect to create an electrical open therein.