In a multi-channel analog-to-digital converter (ADC), in which the ADC sequentially converts analog values that are input from different analog sensors, separate sample-and-hold circuits may be used to read all the analog values at the same time, and the ADC may then sequentially convert the values from each sample-and-hold circuit. This approach allows a single ADC to be used in time-critical applications that require all the analog sensor values to be measured at the same time.