In one embodiment, an integrated circuit includes a serial link interface configured to send and receive data over a serial bus both during normal operation and during scan tests. The integrated circuit may include data routing circuitry for transferring data between the serial link interface and a scan chain during a scan test, and for transferring data between the serial link interface and a core logic circuit of the integrated circuit, without going through the scan chain, during normal operation. Scan data may be generated and analyzed by a tester integrated circuit coupled to the integrated circuit over the serial bus.