A semiconductor device includes a first surface faced to a mounting board when the semiconductor device is placed over the mounting board and a second surface opposed to the first surface. The semiconductor device also includes a position reference portion which is provided in an area including sides of the second surface and which has an optical reflection factor different from that of the mounting board.

 
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< Ion beam irradiation apparatus and ion beam irradiation method

> Dielectrically transduced single-ended to differential MEMS filter

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