Measurement of jitter in a system uses a digital test sequence including many repetitions of a test pattern. An Acquisition Record is made of the entire test sequence. A complete Time Interval Error (TIE) Record is made of the Acquisition Record. The complete TIE Record is separated into a collection of Component TIE Records, one for each transition in the test pattern, and that collectively contain all the different instances in the test sequence of that transition in the test pattern. An FFT is performed on each component TIE Record, and the component FFTs are processed to obtain timing jitter data for the digital signal.