A semiconductor device comprising a bipolar transistor having a base
region, an emitter region and a collector region, wherein the base region
comprises polycrystalline semiconductor material formed by crystallizing
silicon, germanium or silicon germanium in contact with a silicide,
germanide or silicide germanide is described. The emitter region and
collector region also may comprise polycrystalline semiconductor material
formed by crystallizing silicon, germanium or silicon germanium in
contact with a silicide, germanide or silicide germanide forming metal.
The polycrystalline semiconductor material is preferably silicided
polysilicon, which is formed in contact with C49 phase titanium silicide.