A system and method are disclosed for providing EEPROM devices that combine the high endurance features of complex and expensive EEPROM devices and the low manufacturing costs of CMOS compatible EEPROM devices. A memory cell of the invention comprises a control capacitor, an erase capacitor, and a program capacitor, each of which comprises an NMOS transistor. The gates of the three NMOS transistors are connected together to form a floating gate. The drain of the NMOS transistor of the program capacitor is separately connected so that the program capacitor can also serve as a read transistor. A memory cell of the invention can be programmed or erased in an array of memory cells without disturbing the other memory cells in the array.