The disclosure is directed toward systems and methods of defect description of a data storage medium. In a particular embodiment, a method includes determining a first defect of a data storage medium. The method also includes determining a format of an entry of a defect description table based on the first defect and a location of a second defect of the data storage medium. The format is selected from one of a plurality of formats. The method also includes storing a description of the first defect in the entry of the defect description table in the format.