A dual function detector device operates in either a normal operating mode or in an EMI correction mode to suppress effects of EMI within the detector. The detector device may be a flat panel x-ray detectors used in x-ray imaging systems. The device has a pixel architecture and panel read-out technique that enables real-time, high spatial frequency measurement of noise induced by electromagnetic radiation on a digital x-ray detector. The measurement can be used to calibrate the detector in real-time to attain artifact-free imaging in all environments, including those that contain temporally and spatially changing electromagnetic fields.