Cleaning systems for cleaning fuser devices in electrostatographic printing apparatuses and methods of cleaning fuser devices using such cleaning systems are provided. The disclosed cleaning systems include flexible substrates having a surface coated with a high surface-energy film and optionally having an abrasive surface opposite the coated surface. The high surface-energy film contacts a surface of a fuser member and removes contaminants. Optionally, the fuser surface may be pre-cleaned by the abrasive surface prior to contacting the high surface-energy film.