A method for testing an internal bus of a random access memory ("RAM") device, the RAM device having an internal cache coupled to a memory array by the internal bus, the method comprising: writing a value to an address in the RAM device, the value being stored in the internal cache, the value corresponding to at least one line of an external bus; writing a number of additional values to addresses in the RAM device other than the address to push the value from the internal cache into the memory array; reading a value from the address; and, determining whether the internal bus is faulty by comparing the value written to the value read.