A method of more efficiently, easily and cost-effectively analyzing the performance of a device model is disclosed. Embodiments enable automated generation of theoretical performance analysis for a device model based upon a workload associated with rendering graphical data and a configuration of the device model. The workload may be independent of design configuration, thereby enabling determination of the workload without simulating the device model. Additionally, the design configuration may be updated or changed without re-determining the workload. Accordingly, the graphical data may comprise a general or random test which is relatively large in size and covers a relatively large operational scope of the design. Additionally, the workload may comprise graphical information determined based upon the graphical data. Further, the theoretical performance analysis may indicate a graphics pipeline unit of the device model causing a bottleneck in a graphics pipeline of the device model.