A method for continuous, non lot-based manufacturing of integrated circuit
(IC) devices of the type to each have a unique fuse identification (ID)
includes: reading the fuse ID of each of the IC devices; advancing
multiple lots of the IC devices through, for example, a test step in the
manufacturing process in a substantially continuous manner; generating
data, such as test data, related to the advancement of each of the IC
devices through the step in the process; and associating the data
generated for each of the IC devices with the fuse ID of its associated
IC device.