Systems and methods for controlling the execution of LBIST test cycles to allow identification of errors in bit patterns produced by the functional logic of a device under test. In one embodiment, an LBIST controller enables continuous execution of LBIST test cycles (including functional and scan shift phases) prior to a test cycle in which an error arises. In the test cycle in which the error arises, the controller allows execution of the functional phase, but not the following scan shift phase. The computed bit patterns captured in the scan chains are thereby retained in the scan chains, rather than being accumulated into a single MISR signature value. The computed bit patterns can then be retrieved from the scan chains (e.g., via a JTAG chain) and examined to determine the exact location of the error.