Methods and systems for semiconductor testing. In one embodiment, a semiconductor testing method includes one or more of the following stages: defining a rule relating to semiconductor testing, validating the rule, bundling the rule with other rules, correlating the rule with other rules, publishing the rule, actualizing the rule, and follow up relating to the rule. In one embodiment, a semiconductor testing system includes one or more of the following modules: rule creation module(s), analysis module(s), simulation module(s), real time production module(s), and offline production module(s). In one embodiment, user friendly graphical user interface(s) can be used for defining the building blocks of a rule and/or for viewing an optional hierarchy of categories to which the rule belongs.

 
Web www.patentalert.com

< Method, apparatus, and article of manufacture for estimating parameters of a probability model on shared device usage probabilistic semantic analysis

> Method and system for obtaining a combination of faulty parts from a dispersed parts tree

> Sentence classification device and method

~ 00536