A duty cycle correcting circuit for an integrated circuit memory automatically corrects the duty cycle of an input clock by measuring the relative difference between the high time and low time of the input signal and using this measurement to achieve a same-frequency, duty cycle adjusted output signal. The duty cycle correcting circuit includes a duty cycle adjust circuit that uses two series-connected N-channel transistors to control the pull-up slew rate of a signal and another N-channel transistor to control the pull-down slew rate of the same signal, two dual-slope integrator circuits, and input and output signal buffering.