A surface profile measuring apparatus includes a light source assembly, a spatial light modulator, a spectroscope, a wave-front sensor, and a control-processing device. The light source assembly has a liquid crystal display pixel structure and is configured for providing parallel light. The spatial light modulator is positioned to receive the light from the light source assembly. The spectroscope is positioned to receive the light from the spatial light modulator. The wave-front sensor is positioned to receive the light from the spectroscope. The control-processing device is electrically connected to the spatial light modulator and the wave-front sensor. The surface profile measuring apparatus can measure the surface profile of an object and not contact the surface of the object in cooperation with the spatial light modulator, the spectroscope and the wave-front sensor. Therefore, the surface of the object is protected from being damaged.