This invention provides an integrated circuit (IC) optical detector. The IC optical detector comprises a substrate and an IC. The substrate comprises a plurality of test sites defined thereon. The test sites comprise a surface suitably treated for coating of at least one test sample. The at least one test sample is capable of being changed by a reaction. The IC comprises at least one optical sensor array for simultaneously receiving and sensing optical signals from the test sites during operations Presence of at least one changed test sample at a test site changes the quantity of light directed through the test site. The change in quantity of light is detectable by the sensor array. The optical sensor array further converts the sensed optical signals to electrical signals. The IC automatically processes and outputs the electrical signals during operation.This invention further provides a method for detecting a specific sample within at least one test sample. The method comprises securing said test sample on a plurality of test sites defined on a substrate; processing said test sample to allow said test sample to be optically differentiated; directing a light at said test sample; simultaneously receiving and sensing optical signals from said test sample using at least one optical sensor array of an IC; converting said sensed optical signals to electrical signals by said optical sensor array; and automatically processing and outputting said electrical signals by said IC to detect said specific sample within said test sample.