The present invention relates to a device and system from doing mechanical
and electrical measurements and manipulation on nano or micro sized
objects using a sample holder adapted to fit in situ of a transmission
electron microscope. The sample holder comprise at least two arms each
with at least one connector whereby the sample (206) may be mounted
between the two connectors forming a bridge closing a gap between the two
arms of the sample holder. The sample holder is arranged to provide
mechanical forces to a sample mounted on the sample holder and measuring
and/or applying electrical signals from the sample while at the same
imaging using the transmission electron microscope. Each arm of the
sample holder may comprise three substantially parallel beams for
electro-thermal actuation.