An antireflective member according to the present invention has an uneven surface pattern, in which unit structures are arranged in x and y directions at respective periods that are both shorter than the shortest wavelength of an incoming light ray, on the surface of a substrate and satisfies the following Inequality (1): .LAMBDA. x , y .lamda. min < 1 ni + ni sin .theta. i max ( 1 ) ##EQU00001## where .lamda..sub.min is the shortest wavelength of the incoming light ray, .theta.i.sub.max is the largest angle of incidence of the incoming light ray, ni is the refractive-index of an incidence medium, .LAMBDA.x is the period of the uneven surface pattern in the x direction, and .LAMBDA.y is the period of the pattern in the y direction. As a result, diffraction of short-wave light components can be reduced in a broad wavelength range.