An infrared target for use with indoor industrial G.P.S. has at least one mask or overlay applied to the lens of the target. The mask increases the precision of setting the location of any instrument, assembly, machinery, or component to be machined, during industrial applications. The mask improves position tolerances to 0.0005 inch or less. Further, a reflective ring positioned upon the overlay serves as a marker for laser light at lesser tolerance than the overlay.