Systems and methods disclosed herein provide temperature monitoring within an integrated circuit. For example, in accordance with an embodiment of the present invention, a bandgap reference circuit provides a reference voltage; a constant current generator provides a constant current; and a reference signal circuit receives the reference voltage and provides a reference signal having a selectable value based on the reference voltage. A bipolar diode receives the constant current and provides a sense signal, with a value of the sense signal corresponding approximately to a temperature value of the integrated circuit. A comparator receives the sense signal and the reference signal and provides a temperature sensor output signal.