Embodiments of the invention are generally directed to systems, methods, and apparatuses for using the same memory type for both error check and non-error check systems. In an embodiment, a memory device is capable of operating in an error check mode and in a non-error check mode. The memory device includes an output having N error check bit paths for every M data bit paths. In one embodiment, the memory device is to transfer N error check bits with a corresponding M data bits, if the memory device is operating in an error check mode. Other embodiments are described and claimed.