Example embodiments may provide a layout structure and layout method for a
memory device that may reduce the area of the memory device. Example
embodiment layout structures may include a first region and/or a second
region. First and second sensing MOS transistors of a sense amplifier
that senses data of a bit line and a complementary bit line may be
arranged in the first region. First, second and third equalization MOS
transistors of an equalizer that equalizes the bit line and the
complementary bit line may be arranged In the second region located apart
from the first region, Sensing NMOS transistors and equalization NMOS
transistors may share an N-type active region in the layout structure of
a memory device, and the area of a sense amplifier may be reduced.