A method of testing a memory is provided that includes initiating a test on a computer readable memory. The computer readable memory provides output data associated with the test. Further, the method includes selecting to receive the output data from a first register or a second register. In a particular embodiment, the method may include selecting to receive the output data from the first register or the second register by use of a control line. In another particular embodiment, the method may include selecting to receive the RAM input data from the first register or the second register by use of a control line. The control line is configured dynamically by hardware or software on cycle by cycle basis. In a particular embodiment, the test is a built-in-self-test (BIST).