A method and an arrangement for an intelligent adaptive x-ray imaging
system, in which the exposure conditions of the object to x-rays is
dynamically controlled and optimized in real-time in order to provide the
optimum diagnostic information. The arrangement splits the imaging beam
into two separate fan beams that scan over the object in a single pass,
where the first beam (scout) collects information from the object, that
is analyzed to control the intensity or spectral quality or spatial
distribution of the second beam (I-ImaS). The CMOS image sensors deployed
in the arrangement are able to process detected information either
on-chip or within a field programmable gate array, so as to compute a
measure related to the diagnostic value of the information.