A system and method to improve the high voltage performance of an x-ray
tube with electrostatic deflection of an electron beam focal spot. The
system and method provides protection of bias circuits from high voltage
transients and spit protection in x-ray tubes through the use of a high
voltage transient suppression and spit protection circuit assembly
coupled between the bias circuits of a high voltage generator and an
x-ray tube vacuum housing of an x-ray generation system.