An integrated circuit memory device is designed for high speed data access
and for compatibility with existing memory systems. An address strobe
signal is used to latch a first address. During a burst access cycle the
address is incremented internal to the device with additional address
strobe transitions. A new memory address is only required at the
beginning of each burst access. Read/Write commands are issued once per
burst access eliminating the need to toggle the Read/Write control line
at the device cycle frequency. Transitions of the Read/Write control line
during a burst access will terminate the burst access, reset the burst
length counter and initialize the device for another burst access. The
device is compatible with existing Extended Data Out DRAM device pinouts,
Fast Page Mode and Extended Data Out Single In-Line Memory Module
pinouts, and other memory circuit designs. Additionally, a DRAM is
provided having both pipelined and burst Extended Data Out modes of
operation and the ability to switch between them.