A trimming circuit, an electronic circuit, and a trimming control system for reducing the risk of failures when perform trimming and for ensuring that a desired device is readily manufactured. A selector, a resistor, and a fuse are connected in series between a power supply and ground. A probe pad for performing probe trimming is connected immediately above the fuse. The selector includes two back-to-back connected n-type MOS transistors. Each n-type MOS transistor has a gate terminal connected to a selector control circuit. A trim sense circuit is arranged at a power supply side of the fuse. The trim sense circuit detects fuse breakage and changes the operation of an element associated with each trimming circuit TC based on the detection.