A detection method for identifying unintentionally forward-biased diode devices identifies one or more forward-biased diodes directly from a graphical representation of an integrated circuit (IC) device design. The graphical representation describing one or more IC components as a plurality of geometric shapes that correspond to a set of patterns in at least one semiconductor layer. A detection method may work in conjunction with one or more checks (e.g., electrical rule check (ERC)) to analyze the graphical representation and ensure its manufacturability by reducing the likelihood the forward-biased diodes will be present in the manufactured IC device.