A technique to detect defects when reading a defect scan pattern stored on a disk in which the detected defects are processed differently depending on which region of a sector the defect is resident. In one implementation, a mask is used to identify the defects of different regions. By differentiating different regions within the sector for defect scan, sync mark and preamble fields may be treated as critical regions so that different defect scan properties may be attributed when performing the defect scan.