An imaging device comprising an array of pixels fabricated using a microelectronic technology such as CMOS is disclosed. The imaging device provides information regarding rapid increases in incident radiation. The sensor is sensitive to a variable quantity to be imaged, such as visible or non-visible radiation, and a signal representative of the quantity is output. The quantity is measured over a monitoring period, and the timing of the incidence may also be output.

 
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< Radiation image conversion panel, production method of the same, and X-ray image capturing system

< Input device which emits and/or reflects optical electromagnetic radiation for use on a display screen

> Service provider inheritance in a digital information system

> High throughput baggage inspection system

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