The manufacturing yield of an A/D converter semiconductor chip is significantly increased by utilizing a number of A/D converter circuits that include a group of redundant A/D converter circuits. As a result, the semiconductor chip can be wired to form a "good" A/D converter semiconductor chip as long as the number of "bad" A/D converter circuits does not exceed the number of redundant A/D converter circuits.

 
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> Successive approximation ADC with binary error tolerance mechanism

> MRI system comprising a scan room interface for A/D-conversion of MR signals between a receiver coil unit and a remote signal processing unit

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