Control of the angle-of-incidence of a beam of electromagnetic radiation provided by a horizontally oriented arc-lamp in ellipsometer, polarimeter, spectrophotometer, reflectometer, or the like systems.

 
Web www.patentalert.com

< Pathogen and particle detector system and method

< Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device

> Method and system for estimating surface plasmon resonance shift

> Surface plasmon enhanced fluorescence sensor and fluorescence detecting method
~ 00614